Scientific Program


TUTORIALS

Rietveld Texture/Stress Analysis by diffraction using MAUD


New lab instruments and beam lines at large facilities permit nowadays the rapid collection of several patterns or diffraction images in a reasonable time. This type of data can be analysed efficiently using the Rietveld Stress-Texture models implemented in the software Maud to obtain several information about the measured sample.

By this tutorial we will show how to import multiple patterns and/or diffraction images and select the appropriate models (for texture, stress, microstructure etc.) based on the sample characteristics to finally perform the refinement and fitting of the data. The instructor will demonstrate one or few specific examples and the attendees are encouraged to follow the instructions to perform the same analysis on his own laptop. The participants should download and install the Maud program from the web site as well as some tutorial data that will be made available few weeks before the workshop. The web site for Maud is at http://maud.radiographema.com

It is advisable to follow at least one of the basic tutorials (or video tutorials) on Maud before attending this session to really catch the most from the hands-on exercises. In addition, a bit of basic knowledge in crystallography and texture/stresses may help as well.


Instructor’s name

Topics

Number of Hrs

Luca Lutterotti

Diffraction and Crystallographic Texture Analysis

1

Luca Lutterotti

Rietveld, Phase and Line broadening analysis.

1

Luca Lutterotti

The combined solution

1

Luca Lutterotti

The MAUD software

2

Luca Lutterotti

High Pressure data

1


Instructors


Luca Lutterotti
University of Trento
Italy
E-mail: luca.lutterotti@unitn.it

Time schedule

Starting time: 9:00 am
Coffee break: 10:30-10:45 am
Tutorials: 10:45-12:30
Coffee break: 12:30-12:45 am
Finish: 15:00