Scientific Program


TUTORIALS

Texture Analysis and Electron Backscatter Diffraction


Electron Backscatter Diffraction (EBSD) in the Scanning Electron Microscope (SEM) can be used to acquire the crystallographic orientation data needed for texture analysis of polycrystalline materials. EBSD provides point-specific orientation data as opposed to the area and volume based sampling provided by X-Ray and Neutron diffraction respectively. Thus, not only is it important to follow good practices for general EBSD data acquisition, but there are also various factors to consider when using EBSD for texture analysis. General EBSD practices as well as those specific to texture analysis will be presented and discussed in this tutorial. Where possible, attendees should bring a laptop for the tutorial in order to follow along with hands-on exercises and case-studies.

Tutorial Outline

Instructor’s name

Topics

Number of Hrs

Stuart Wright

Data Acquisition

2

David Field

Texture Analysis

1

Stuart Wright

Boundary Textures

1

Stuart Wright

Data Processing

1

David Field

Deformation Analysis

1


Instructors


Stuart I. Wright
EDAX
USA
Phone: +1 (801) 560-3103
E-mail: Stuart.wright@ametek.com

David P. Field
The School of Mechanical and Materials Engineering
USA
Phone: +1 (509) 335-3524
E-mail: dfield@wsu.edu

Time schedule

Starting time: 9:00 am
Coffee break: 10:30-10:45 am
Tutorials: 10:45-12:30
Coffee break: 12:30-12:45 am
Finish: 15:00