This symposium has organized annually since 2010, and provides an interactive forum for discussing the advances in synthesis, characterization, properties, processing, applications, basic research trends, modeling, etc., all related to the area of materials characterization.

The structural and chemical characterization of the materials can be metals, alloys, steels, metal compounds, welding, alloys for medicals applications, etc. They can be amorphous, crystalline, powders, fibers, thin films, etc., which could be prepared with different techniques like sol-gel, laser ablation, sputtering, CVD, solid state reactions, infiltration, normal casting, mechanical alloying, etc.

The structural characterization techniques may include scanning electron microscopy (SEM), X-ray diffraction (XRD), transmission electron microscopy (TEM), atomic force microscopy (AFM), optical microscopy (OM), mechanical characterization, atomic absorption, luminescence, thermo luminescence, energy transfer, photorefractive effect, birefringence, photo catalysis, photoconductivity, birefringence, laser emission, etc. Theoretical models from these properties can be included, too.

Symposium Topics

  • Characterization by Scanning Electron Microscopy and Transmission Electron Microscopy
  • Characterization by X-Ray diffraction
  • Characterization by Raman Spectroscopy
  • Characterization by Optical Microscopy
  • Characterization by Photoacoustic techniques and Photoluminescence
  • Theoretical models used on structural and chemical characterization
  • Characterization of thin layers and coatings, metals and alloys, welds and joining materials, steels, materials for medical applications

Invited Speakers

Tom Blanton (International Centre for Diffraction Data, USA), Jose Miguel Delgado (Universidad de los Andes, Venezuela)